In the era of advanced materials, semiconductors, and micro-electromechanical systems, traditional optical microscopy has hit the physical barriers dictated by the wavelength of light. To observe microscopic architectures at the nanometer scale, researchers and engineers must pivot toward electron beam technology.

To address the demanding need for high-resolution surface morphology and microstructural analysis, Maxlab Equipment proudly introduces today’s premier analytical solution: the SS-160 – a next-generation scanning electron microscope (SEM) that integrates breakthrough electromagnetic lens systems and matrix detectors to bring the micro-world into sharp, realistic focus.

The SS-160 is a high-end scanning electron microscope (SEM) engineered for materials research centers, national laboratories, and Quality Assurance/Quality Control (QA/QC) departments within high-tech manufacturing facilities. Benefiting from extensive upgrades over its predecessor models, the SS-160 boasts an exceptionally powerful electron source, high beam stability, and an expanded sample chamber environment.

The device operates by sweeping a finely focused, high-energy electron beam across the target sample’s surface. As these electrons interact with the specimen, they trigger the emission of various signals. The onboard detector matrix captures these signals to reconstruct highly detailed three-dimensional images of the surface topography, letting operators visualize the smallest foundational elements of their materials.

The advanced electromagnetic optical column of the SS-160 has been deeply optimized, enabling the instrument to achieve an effective magnification of more than 150,000 times. Combined with active kinematic vibration isolation and electromagnetic interference shielding, the imagery generated by the SS-160 features an outstanding depth of field. This yields a pronounced 3D stereoscopic effect, allowing lab technicians to seamlessly evaluate complex fractures, roughness, and irregular multi-level surfaces.

The SS-160 comes fully equipped with the two core detector modalities essential for modern SEM analysis:

The system provides flexible adjustments over the electron beam’s accelerating voltage. At lower voltage settings (1kV – 5kV), technicians can easily observe beam-sensitive specimens, biological samples, or non-conductive materials (such as polymers and uncoated ceramics) without causing thermal or structural damage to the surface. At high voltage limits (up to 30kV), the electron beam achieves deep penetration, heavily exciting the characteristic signals necessary for comprehensive microanalysis.

The spacious specimen chamber of the SS-160 is structurally expanded, accommodating large-scale or awkwardly shaped objects without forcing technicians to cut or destroy the samples beforehand. The automated specimen stage supports comprehensive motorized movement across 5 independent axes (X, Y, Z, Rotation, and Tilt). Operators can effortlessly manipulate the sample’s perspective directly via software mouse clicks.

One of the most valuable aspects of the SS-160 scanning electron microscope is its modular design, allowing smooth integration with an Energy Dispersive X-ray Spectrometer (EDS).

When the primary electron beam impacts the specimen, it prompts target atoms to release characteristic X-rays unique to each element. The EDS detector logs these energetic pulses, transforming the SS-160 from a purely visual microscope into a dual imaging and chemical profiling workstation capable of:

Thanks to its heavy-duty performance and versatility, the SS-160 SEM serves as a core analytical pillar across numerous industrial sectors in Vietnam:

Investing in a scanning electron microscope system demands substantial capital alongside rigorous facility requirements and precise maintenance schedules. Maxlab Equipment stands as your premier, trusted partner, supporting industrial enterprises and research institutes throughout the procurement and deployment of the genuine SS-160.

By selecting an analytical solution from Maxlab Equipment, your organization benefits from:

Contact Maxlab Equipment today to receive a comprehensive technical proposal, official pricing details, and to schedule an expert consultation regarding the SS-160 scanning electron microscope for your facility!